The Sixth
International Symposium on
Measurement Technology and
Intelligent Instruments
28 November - 1 December
2003
Keynote Addresses
Novel Optical Techniques for Nanometer Measurements
Takashi Miyoshi, Osaka University,
Japan
Abstract and Brief Biography
The NIST Standard Bullets and Casings Project
Jun-Feng Song, National Institute of Standards and Technology,
USA
Abstract and Brief Biography
Advances in Micro and Nano-Scale Surface Metrology
Liam Blunt, University of Huddersfield,
UK
Abstract and Brief Biography
On-Line Industrial 3D Measurement
Techniques for Large Volume Objects
Shenghua Ye,
Tianjin University,
China
Abstract and Brief Biography
Number of visits:
09 March 2010