09 March 2010
The Sixth
International Symposium on
Measurement Technology and
Intelligent Instruments
28 November - 1 December
2003
Second
Second Announcement
ISMTII 2003
The Sixth International Symposium on Measurement Technology and Intelligent Instruments
28 November - 1 December 2003
Hong Kong University of Science and Technology,
Clear Water Bay, Kowloon, Hong Kong, China
International Steering Committee
Z. Li, Chair, Huazhong University of Science and Technology, China
A. Shimokohbe, Co-chair, Tokyo Institute of Technology, Japan
S. H. Ye, Co-chair, Tianjin University, China
C. K. Chen, Co-chair, National Cheng Kung University, Taiwan, China
L. Blunt, University of Huddersfield, UK
Y. Chugui, Technological Design Institute of Scientific Instrument Engineering,
Russia
I. Dudas, University of Miskolc, Hungary
Y. T. Fei, Hefei University of Technology, China
I. Frollo, Slovak Academy of Sciences, Slovakia
M. N. Frota, Brazilian Society of Metrology, Brazil
V. Hans, University of Essen, Germany
R. J. Hocken, University of North Carolina at Charlotte, USA
C. Hsu, Center for Measurement Standards, Taiwan, China
R. Jablonski, Warsaw University of Technology, Poland
S. Kiyono, Tohoku University, Japan
R. Leach, National Physical Laboratory, UK
Y. Z. Lei, National Natural Science Foundation of China, China
G. Lin, University of South Australia, Australia
T. Miyoshi, Osaka University, Japan
E. A. Mokrov, Tsiolkovsky Russian Academy of Cosmonautics, Russia
J. Ni, University of Michigan at Ann Arbor, USA
H. Ohmori, Institute of Physical and Chemical Research, Japan
P. H. Osanna, Vienna University of Technology, Austria
J. Song, National Institute of Standards and Technology, USA
K. Takamasu, University of Tokyo, Japan
J. B. Tan, Harbin Institute of Technology, China
S. L. Zhang, Tsinghua University, China
Z. F. Zhou, Sichuan University, China
Scientific Committee
Z. Li, Chair, Huazhong University of Science and Technology, China
K. C. Fan, Co-chair, National Taiwan University, Taiwan, China
W. Gao, Co-chair, Tohoku University, Japan
Y. Gao, Co-chair, Hong Kong University of Science and Technology, Hong Kong,
China
X. Q. Jiang, Co-chair, University of Huddersfield, UK
P. Cai, Shanghai Jiao Tong University, China
L. D. Chiffre, Technical University of Denmark, Denmark
M. N. Durakbasa, Vienna University of Technology, Austria
R. Gao, University of Massachusetts, USA
C. P. Grover, Institute for National Measurement Standards, National Research
Council, Canada
H. Haitjema, Eindhoven University of Technology, The Netherlands
P. S. Huang, State University of New York at Stony Brook, USA
W. H. Huang, University of Science and Technology of China, China
K. C. Jiang, University of Birmingham, UK
Z. D. Jiang, Xi’an Jiaotong University, China
R. K. Kang, Dalian University of Technology, China
S. C. Kim, Chungbuk National University, Korea
S. W. Kim, Korea Advanced Institute of Science and Technology, Korea
V. Korepanov, National Academy of Sciences and National Space Agency, Ukraine
M. Krystek, PTB, Germany
S. Y. Lim, Singapore Institute of Manufacturing Technology, Singapore
Z. C. Lin, National Taiwan University of Science and Technology, Taiwan, China
C. Liu, Dalian University of Technology, China
X. Liu, University of Warwick, UK
H. J. Pahk, Seoul National University, Korea
G. B. Picotto, Istituto di Metrologia G. Colonnetti, Italy
S. R. Qin, Chongqing University, China
B. Ramamoorthy, Indian Institute of Technology at Madras, India
H. Roth, University of Siegen, Germany
F. Schneider, Technical University of Munich, Germany
P. Scott, Taylor Hobson Limited and University of Huddersfield, UK
W. K. Shi, Shanghai Jiao Tong University, China
R. Taymanov, D. I. Mendeleyev Institute for Metrology, Russia
G. Varga, University of Miskolc, Hungary
L. Z. Wang, Institute of Metrology, China
T. B. Xie, Huazhong University of Science and Technology, China
G. Z. Yan, Shanghai Jiao Tong University, China
S. H. Yeo, Nanyang Technological University, Singapore
L. J. Zeng, Tsinghua University, China
J. G. Zhou, Drexel University, USA
Organizing Committee
Y. Gao, Chair, Hong Kong University of Science and Technology, Hong Kong,
China
K. C. Fan, Co-chair, National Taiwan University, Taiwan, China
W. Gao, Co-chair, Tohoku University, Japan
X. Q. Jiang, Co-chair, University of Huddersfield, UK
Z. Y. Chen, National Natural Science Foundation of China, China
J. F. Jorgensen, Image Metrology Company, Denmark
P. Koshy, McMaster University, Canada
A. K. T. Lau, Hong Kong Polytechnic University, Hong Kong, China
E. Okuyama, Akita University, Japan
R. M. M. Orrego, Methodist University of Piracicaba, Brazil
S. Q. Peng, Huazhong University of Science and Technology, China
X. H. Qu, Tianjin University, China
K. Sapozhnikova, D. I. Mendeleyev Institute for Metrology, Russia
S. Takahashi, University of Tokyo, Japan
J. Wahrburg, University of Siegen, Germany
H. Wei, University of Reading, UK
H. X. Wu, Huazhong University of Science and Technology, China
W. Xu, University of Surrey, UK
L. H. Yam, Hong Kong Polytechnic University, Hong Kong, China
S. X. Yang, Zhejiang University, China
C. Y. Ying, Tsinghua University, China
K. D. Yue, Xi’an Jiaotong University, China
J. G. Zhu, Tianjin University, China
ISMTII 2003 First Announcement and Call for Papers
For other details of ISMTII 2003, please refer to the First Announcement and Call for Papers.
Further Information
For further information, please write to
Dr. Y. Gao
ISMTII 2003
MECH ENG DEPT, HKUST
Clear Water Bay, Kowloon, Hong Kong
Phone: 852-2358-8649
Fax: 852-2358-1543
E-mail: meygao@ust.hk
ISMTII 2003 Homepage
http://ihome.ust.hk/~meygao/ISMTII2003/
Number of visits:
09 March 2010